METHOD AND SYSTEM FOR MEASURING POLYCRYSTALLINE CHUNK SIZE AND DISTRIBUTION IN THE CHARGE OF A CZOCHRALSKI PROCESS
Patent №
US 6,589,332
Granted
2003-07-08
Filed 1999
Owner
MEMC ELECTRONIC MATERIALS, INC.
Lab
—
AI components
2
vision · evo
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09419151
A method and system for determining polycrystalline silicon chunk size for use with a Czochralski silicon growing process. Polycrystalline silicon chunks are arranged on a measuring background. A camera captures an image of the chunks. An image processor processes the image and determines the dimensions of the chunks based on the captured image. A size parameter associated with the chunks is determined.
AI classification
Ownership
MEMC ELECTRONIC MATERIALS, INC.
assignment · 103230705
Assignors
HOLDER, JOHN D., JOSLIN, STEVEN, SREEDHARAMURTHY, HARIPRASAD, LHAMON, JOHN
On an employer assignment, the assignors are typically the inventors.