Patent №
US 6,606,574
Granted
2003-08-12
Filed 2001
Owner
MITSUBISHI DENKI KABUSHIKI KAISHA
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09876234
A method and system for quality control of a production line. Troubles with quality are prevented by detecting a trend in quality characteristics of the production line or fluctuations in an early stage. The absolute values of the differences between same kinds of the data obtained at given measurement points regarding quality control data or the absolute values of the differences between same items of one kind of SPC data are used as a controlled item for detecting a trend in quality control characteristics or fluctuations of the quality control characteristics. The differences between maximum and minimum values of the quality control data at measurement points within the same lot or within the same wafer are used as the differences between same kinds of the quality control data, for example.
AI classification
Ownership
MITSUBISHI DENKI KABUSHIKI KAISHA
assignment · 121650920
Assignors
TAKANABE, NAOKO
On an employer assignment, the assignors are typically the inventors.