METHOD OF LEARNING DEFORMATION MODELS TO FACILITATE PATTERN MATCHING

Patent №

US 6,701,016

Granted

2004-03-02

Filed 2000

Owner

MICROSOFT CORPORATION

AI components

3

ml · vision · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09747885

A model characterizes an error pattern that is functionally related to first and second patterns and to one or more model parameters, which may be unknown. The error pattern may be derived by deforming one or both of the first and second patterns, such as by applying a generally smooth, non-uniform deformation field. A likelihood for the model that the error pattern is zero, given the second pattern, is determined. If the model parameter(s) is unknown, the likelihood may be used to estimate (or infer) the parameter(s) that tend to maximize the likelihood for a plurality of stored patterns. The estimated parameters may, in turn, be employed to determine the likelihood as a measure of similarity between an observed pattern and the patterns that the model is capable of generating. In addition, the likelihood may be used to classify an observed pattern according to the likelihood that the observed pattern has relative to one or more models.

AI classification

Vision1.00
Machine learning1.00
AI hardware1.00
Planning0.01
Natural language0.01
Evolutionary computation0.01
Knowledge representation0.00
Speech0.00

Ownership

MICROSOFT CORPORATION

assignment · 115630304

Assignors

JOJIC, NEBOJSA, SIMARD, PATRICE

On an employer assignment, the assignors are typically the inventors.

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