KNOWLEDGE-BASED INTELLIGENT FULL SCAN DUMP PROCESSING METHODOLOGY

Patent №

US 6,728,938

Granted

2004-04-27

Filed 2002

Owner

SUN MICROSYSTEMS, INC.

Lab

AI components

3

ml · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10132916

A systematic methodology to analyze a full scan dump is presented. The methodology is knowledge-based, i.e., the methodology intelligently processes a full scan dump using knowledge of the system from which the full scan is obtained.

Machine learningPlanningAI hardwareG06F 11/267G01R 31/318544G01R 31/318569

AI classification

Planning1.00
AI hardware0.99
Machine learning0.99
Knowledge representation0.46
Natural language0.03
Speech0.00
Vision0.00
Evolutionary computation0.00

Ownership

SUN MICROSYSTEMS, INC.

assignment · 128480619

Assignors

CHANG, SI-EN

On an employer assignment, the assignors are typically the inventors.

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