Patent №
US 6,741,353
Granted
2004-05-25
Filed 2002
Owner
J.A. WOOLLAM CO. INC.
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10199536
Disclosed is methodology for determination of parameters which characterize parameters such as thickness, color or quality of films deposited onto objects of arbitrary shapes, utilizing spectroscopic ellipsometry applied to standard shaped objects.
PlanningG01N 21/211
AI classification
Planning1.00
Machine learning0.01
Natural language0.00
Knowledge representation0.00
Vision0.00
AI hardware0.00
Evolutionary computation0.00
Speech0.00
Ownership
J.A. WOOLLAM CO. INC.
assignment · 134100256
Assignors
JOHS, BLAINE D., JOHS, BLAINE D.
On an employer assignment, the assignors are typically the inventors.
From the same owner
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