GRAPHIC CONTOUR EXTRACTING METHOD, PATTERN INSPECTING METHOD, PROGRAM AND PATTERN INSPECTION SYSTEM

Patent №

US 6,772,089

Granted

2004-08-03

Filed 2002

Owner

KABUSHIKI KAISHA TOSHIBA

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10188889

A graphic contour extracting method includes: acquiring an image of a graphic form to be inspected; defining an inspection region for the image of the graphic form to be inspected by an inspection graphic form including at least one of a circle, an ellipse, a rectangle, a first rectangular graphic form, a second rectangular graphic form and a closed curved graphic form, at least one end of the first rectangular graphic form being replaced with any one of a semi-circle, a semi-ellipse and a parabola, at least one of four corners of the second rectangular graphic form being replaced with a ¼ circle or a ¼ ellipse, the closed curved graphic form being expressed by the following expression: and the inspection graphic form having an edge searching direction previously defined for at least one component thereof; and searching an edge of the graphic form to be inspected on the basis of the inspection graphic form to acquire contour information of the graphic form to be inspected.

VisionG06V 10/46G06F 18/40G06V 20/66

AI classification

Vision1.00
Knowledge representation0.18
Planning0.00
Natural language0.00
Evolutionary computation0.00
Speech0.00
Machine learning0.00
AI hardware0.00

Ownership

KABUSHIKI KAISHA TOSHIBA

assignment · 135900804

Assignors

IKEDA, TAKAHIRO, MIYANO, YUMIKO

On an employer assignment, the assignors are typically the inventors.

From the same owner

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