GRAPHIC CONTOUR EXTRACTING METHOD, PATTERN INSPECTING METHOD, PROGRAM AND PATTERN INSPECTION SYSTEM
Patent №
US 6,772,089
Granted
2004-08-03
Filed 2002
Owner
KABUSHIKI KAISHA TOSHIBA
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10188889
A graphic contour extracting method includes: acquiring an image of a graphic form to be inspected; defining an inspection region for the image of the graphic form to be inspected by an inspection graphic form including at least one of a circle, an ellipse, a rectangle, a first rectangular graphic form, a second rectangular graphic form and a closed curved graphic form, at least one end of the first rectangular graphic form being replaced with any one of a semi-circle, a semi-ellipse and a parabola, at least one of four corners of the second rectangular graphic form being replaced with a ¼ circle or a ¼ ellipse, the closed curved graphic form being expressed by the following expression: and the inspection graphic form having an edge searching direction previously defined for at least one component thereof; and searching an edge of the graphic form to be inspected on the basis of the inspection graphic form to acquire contour information of the graphic form to be inspected.
AI classification
Ownership
KABUSHIKI KAISHA TOSHIBA
assignment · 135900804
Assignors
IKEDA, TAKAHIRO, MIYANO, YUMIKO
On an employer assignment, the assignors are typically the inventors.