Patent №
US 6,804,572
Granted
2004-10-12
Filed 2000
Owner
LAM RESEARCH CORPORATION
Lab
—
AI components
1
ml
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
09609593
A method enhances a process and profile simulator algorithm to predict the surface profile that a given plasma process will create. The method first tracks an energetic particle and then records the ion fluxes produced by the energetic particle. A local etch rate and a local deposition rate are computed from neutral fluxes, surface chemical coverage, and surface material type that are solved simultaneously.
AI classification
Ownership
LAM RESEARCH CORPORATION
assignment · 111070711
Assignors
COOPERBERG, DAVID, VAHEDI, VAHID
On an employer assignment, the assignors are typically the inventors.