ENHANCED PROCESS AND PROFILE SIMULATOR ALGORITHMS

Patent №

US 6,804,572

Granted

2004-10-12

Filed 2000

Owner

LAM RESEARCH CORPORATION

Lab

AI components

1

ml

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09609593

A method enhances a process and profile simulator algorithm to predict the surface profile that a given plasma process will create. The method first tracks an energetic particle and then records the ion fluxes produced by the energetic particle. A local etch rate and a local deposition rate are computed from neutral fluxes, surface chemical coverage, and surface material type that are solved simultaneously.

Machine learningH01J 37/32935H01J 37/321H01J 37/32174

AI classification

Machine learning0.66
Vision0.04
Evolutionary computation0.02
AI hardware0.00
Natural language0.00
Speech0.00
Planning0.00
Knowledge representation0.00

Ownership

LAM RESEARCH CORPORATION

assignment · 111070711

Assignors

COOPERBERG, DAVID, VAHEDI, VAHID

On an employer assignment, the assignors are typically the inventors.

From the same owner

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