METHOD FOR DETECTING A DEFECT IN A PIXEL OF AN ELECTRICAL DISPLAY UNIT AND A METHOD FOR MANUFACTURING AN ELECTRICAL DISPLAY UNIT

In image-capture inspection of electronic displays, the object of the present invention is to reduce moire generation, improve inspection precision by making pixel defects easier to discover, and allowing quantitative evaluation of these pixel defects.The relative positioning of the electronic display and an imaging element is changed by very small amounts of 1/n of the pixel pitch. The n images are arranged by pixel and the images are combined by taking the moving average of the image data values to reduce the image-capture moires generated during the image capture operations. The composite image is used to inspect pixel defects in the electronic display.