INSPECTION SYSTEM FOR CIRCUIT PATTERNS AND A METHOD THEREOF

Patent №

US 6,831,998

Granted

2004-12-14

Filed 2000

Owner

HITACHI, LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09598652

In order to provide a high-speed, inexpensive inspection system that has a short development period, that is flexible, and that allow algorithms to be easily changed, a PC equipped with an image input feature is used to capture an image detected by a line image sensor, this detected image is transferred to a plurality of PCs connected by a LAN, and defects are detected using software processing on the plurality of PCs.

VisionG06T 7/0004G06V 10/94G06T 2207/30141

AI classification

Vision0.53
Machine learning0.09
AI hardware0.01
Natural language0.00
Evolutionary computation0.00
Knowledge representation0.00
Planning0.00
Speech0.00

Ownership

HITACHI, LTD.

assignment · 112530008

Assignors

KOSHISHIBA, HIROYA, DOI, HIDEAKI, ISOBE, MITSUNOBU, YOSHIMURA, KAZUSHI, KOBAYASHI, HARUOMI, SHISHIDO, CHIE

On an employer assignment, the assignors are typically the inventors.

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