AVAILABILITY, RELIABILITY OR MAINTAINABILITY INDEX INCLUDING OUTAGE CHARACTERIZATION

Patent №

US 6,901,347

Granted

2005-05-31

Filed 2000

Owner

SUN MICROSYSTEMS, INC.

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

09510938

Improved reliability, availability and/or maintainability metrics have been developed that account for customer perceived factors such as frequency of outage, duration of outages, business impact of outages, etc. In various realizations and exploitations, such improved metrics may be utilized for managing and/or monitoring availability of enterprise information services or suites, availability of individual computers, devices or facilities, and/or availability of particular functionality or subsystems of any of the above. In one exploitation, personnel management decisions and/or compensation levels may be based on achieved values for such improved metrics. In other exploitations, contractual commitments and/or incentive fees related to an installed system or systems may be based on such improved metrics.

PlanningG06F 11/008G06F 11/3055

AI classification

Planning1.00
Evolutionary computation0.17
Machine learning0.01
AI hardware0.01
Knowledge representation0.00
Vision0.00
Natural language0.00
Speech0.00

Ownership

SUN MICROSYSTEMS, INC.

assignment · 106270459

Assignors

MURRAY, PAUL S., LEARN, KAREN

On an employer assignment, the assignors are typically the inventors.

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