REDUCING TIME TO MEASURE CONSTRAINT PARAMETERS OF COMPONENTS IN AN INTEGRATED CIRCUIT
Patent №
US 6,904,579
Granted
2005-06-07
Filed 2003
Owner
TEXAS INSTRUMENTS INCORPORATED
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10403080
Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.
AI classification
Ownership
TEXAS INSTRUMENTS INCORPORATED
assignment · 139310580
Assignors
KATLA, SREEKANTHA MADHAVA, PRASAD, VIKAS K., BHOWMIK, SURAVI, SHAH, KALPESH AMRUTHLAL, TEXAS INSTRUMENTS (INDIA) PRIVATE LIMITED
On an employer assignment, the assignors are typically the inventors.