REDUCING TIME TO MEASURE CONSTRAINT PARAMETERS OF COMPONENTS IN AN INTEGRATED CIRCUIT

Patent №

US 6,904,579

Granted

2005-06-07

Filed 2003

Owner

TEXAS INSTRUMENTS INCORPORATED

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10403080

Reducing the time required to measure constraint parameters (setup time, hold time and pulse width) of components in integrated circuits. For example, the delay of propagation of a signal between an input node and an intermediate node of a component are measured. An approximate range of possible values is formulated, and a search (by applying signals assuming one of the values in the approximate range and examining the output signal(s)) is conducted within the range to determine the value of the constraint parameters.

PlanningG06F 30/367G06F 30/3312

AI classification

Planning0.84
AI hardware0.04
Knowledge representation0.01
Evolutionary computation0.00
Natural language0.00
Machine learning0.00
Vision0.00
Speech0.00

Ownership

TEXAS INSTRUMENTS INCORPORATED

assignment · 139310580

Assignors

KATLA, SREEKANTHA MADHAVA, PRASAD, VIKAS K., BHOWMIK, SURAVI, SHAH, KALPESH AMRUTHLAL, TEXAS INSTRUMENTS (INDIA) PRIVATE LIMITED

On an employer assignment, the assignors are typically the inventors.

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