METHOD FOR CALCULATING THRESHOLD VOLTAGE OF POCKET IMPLANT MOSFET

Patent №

US 6,909,976

Granted

2005-06-21

Filed 2002

Owner

SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10231117

A threshold voltage model with an impurity concentration profile in a channel direction taken into account is provided in the pocket implant MOSFET. With penetration length of the implanted pocket in the channel direction and the maximum impurity concentration of the implant pocket used as physical parameters, the threshold voltage model is obtained by linearly approximating the profile in the channel direction. By analytically solving the model by using a new threshold condition with inhomogeneous profile taken into account, the threshold voltage can be accurately obtained. Based on thus obtained model, the threshold voltage can be predicted and can be used for circuit design.

PlanningG06F 30/23G06F 2119/06

AI classification

Planning0.76
Machine learning0.00
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Vision0.00
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Ownership

SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER

assignment · 132440047

Assignors

KITAMARU, DAISUKE, MIURA, MICHIKO

On an employer assignment, the assignors are typically the inventors.

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