SYSTEM FOR MEASURING WAVEFRONT TILT IN OPTICAL SYSTEMS AND METHOD OF CALIBRATING WAVEFRONT SENSORS

Patent №

US 6,924,899

Granted

2005-08-02

Filed 2002

Owner

OPTICAL PHYSICS COMPANY

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10158974

A wavefront tilt measurement system for measuring the wavefront tilt of light passing through transmitting or receiving optical systems, the optical systems including a primary aperture and internal optical elements defining an optical system focal plane. A light source emits light at the optical system focal plane towards the internal optical elements such that light from the light source emerges from the primary aperture. A plurality of tilt sensors are disposed adjacent to the primary aperture to receive light emerging from the primary aperture. Each tilt sensor includes a sensor focal plane and a plurality of detector elements. Each tilt sensor generates at the focal plane a plurality of overlapping regions of zero and first order images of light emerging from the primary aperture. The measured intensity of light in the overlapping regions is used to determine the wavefront tilt of light emerging from the primary aperture.

AI classification

Vision0.65
Natural language0.00
Evolutionary computation0.00
Knowledge representation0.00
Speech0.00
AI hardware0.00
Machine learning0.00
Planning0.00

Ownership

OPTICAL PHYSICS COMPANY

assignment · 132240710

Assignors

HUTCHIN, RICHARD A., OTTO, OBERDAN W.

On an employer assignment, the assignors are typically the inventors.

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