SYSTEM FOR MEASURING WAVEFRONT TILT IN OPTICAL SYSTEMS AND METHOD OF CALIBRATING WAVEFRONT SENSORS
Patent №
US 6,924,899
Granted
2005-08-02
Filed 2002
Owner
OPTICAL PHYSICS COMPANY
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10158974
A wavefront tilt measurement system for measuring the wavefront tilt of light passing through transmitting or receiving optical systems, the optical systems including a primary aperture and internal optical elements defining an optical system focal plane. A light source emits light at the optical system focal plane towards the internal optical elements such that light from the light source emerges from the primary aperture. A plurality of tilt sensors are disposed adjacent to the primary aperture to receive light emerging from the primary aperture. Each tilt sensor includes a sensor focal plane and a plurality of detector elements. Each tilt sensor generates at the focal plane a plurality of overlapping regions of zero and first order images of light emerging from the primary aperture. The measured intensity of light in the overlapping regions is used to determine the wavefront tilt of light emerging from the primary aperture.
AI classification
Ownership
OPTICAL PHYSICS COMPANY
assignment · 132240710
Assignors
HUTCHIN, RICHARD A., OTTO, OBERDAN W.
On an employer assignment, the assignors are typically the inventors.