YIELD/QUALITY IMPROVEMENT USING CALCULATED FAILURE RATE DERIVED FROM MULTIPLE COMPONENT LEVEL PARAMETERS

A method for improving yields in manufacturing processes includes identifying parameters which affect performance at a subsequent step in the process, collecting data concerning individual performance parameters, creating a reference scale which correlates individual parameters with probability of failure at a subsequent step in the process, testing a manufactured unit to collect performance data concerning two or more of the individual parameters from a manufactured unit, comparing performance data concerning two or more of the individual parameters from the manufactured unit to the reference scale to assign probability of failure for each of the single performance parameters, calculating a Figure of Merit, and utilizing the Figure of Merit to sort or disposition units.