METHOD FOR DETERMINING THE REFLECTANCE PROFILE OF MATERIALS

Patent №

US 6,963,403

Granted

2005-11-08

Filed 2003

Owner

COUNCIL OF SCIENTIFIC AND INDUSTRIAL RESEARCH

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10341595

The present invention relates to a method for determining the reflectance profile of materials and more particularly, the present invention relates to a method for calculating specular and diffuse reflectance and hence, the emittance of materials at ambient temperatures.

AI classification

Planning0.77
Machine learning0.01
Natural language0.00
Speech0.00
Vision0.00
AI hardware0.00
Knowledge representation0.00
Evolutionary computation0.00

Ownership

COUNCIL OF SCIENTIFIC AND INDUSTRIAL RESEARCH

assignment · 139950054

Assignors

NAGARAJAN, RAMAKRISHNAN, VARMA, SATHYA PRAKASH, GUPTA, DEVINDER

On an employer assignment, the assignors are typically the inventors.

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