Patent №
US 7,091,990
Granted
2006-08-15
Filed 2004
Owner
LEICA MICROSYSTEMS WETZLAR GMBH
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10496344
A method for blind deconvolution of microscopic images in which only a single parameter is varied for the estimation of the PSF. The single parameter takes account of the optical properties of the environment of the object (40) between the objective (20) of the microscope (1) and the region above the object. The single parameter represents a functional relationship among the parameters of the individual layers.
AI classification
Vision1.00
Planning0.02
Machine learning0.00
Natural language0.00
Knowledge representation0.00
AI hardware0.00
Speech0.00
Evolutionary computation0.00
Ownership
LEICA MICROSYSTEMS WETZLAR GMBH
assignment · 158850375
Assignors
GANSER, MICHAEL, WESNER, JOACHIM
On an employer assignment, the assignors are typically the inventors.
From the same owner
METHOD AND DEVICE FOR OPTICALLY EXAMINING AN OBJECTUS 7,495,778 · 2009METHOD FOR CORRECTING DISTORTIONS IN MULTI-FOCUS IMAGE STACKSUS 7,349,584 · 2008MICROSCOPE AND METHOD FOR OPERATING A MICROSCOPEUS 7,262,907 · 2007Method for automatic focusing an imaging optical system on the surface of a sampleUS 7,041,952 · 2006METHOD AND APPARATUS FOR CODING LIVE IMAGES IN MICROSCOPYUS 6,982,741 · 2006ILLUMINATION DEVICE; AND COORDINATE MEASURING INSTRUMENT HAVING AN ILLUMINATION DEVICEUS 6,975,409 · 2005VIDEO MICROSCOPE METHODUS 6,944,326 · 2005METHOD AND MEASURING INSTRUMENT FOR DETERMINING THE POSITION OF AN EDGE OF A PATTERN ELEMENT ON A SUBSTRATEUS 6,920,249 · 2005