MULTI-RESOLUTION INSPECTION SYSTEM AND METHOD OF OPERATING SAME

Patent №

US 7,187,436

Granted

2007-03-06

Filed 2004

Owner

GENERAL ELECTRIC COMPANY

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10813149

A multi-resolution inspection system and method of operation. The system may comprise a first scanning system having a first resolution, wherein the first scanning system is operable to perform a first resolution scan of a surface area of an object to identify a location of a surface abnormality in the object. The system may also comprise a second scanning system having a second resolution, the second resolution being smaller than the first resolution. The second scanning system is operable to receive the location of the surface abnormality from the first scanning system and to automatically perform a second resolution scan of a defined region of the object around the location of the surface abnormality.

VisionG01N 21/8806G01N 21/8851G01N 21/9515G01N 2021/8867G01N 2021/8874

AI classification

Vision1.00
Knowledge representation0.05
Natural language0.00
AI hardware0.00
Machine learning0.00
Planning0.00
Evolutionary computation0.00
Speech0.00

Ownership

GENERAL ELECTRIC COMPANY

assignment · 151640468

Assignors

HARDING, KEVIN GEORGE, ROSS, JOSEPH BENJAMIN

On an employer assignment, the assignors are typically the inventors.

From the same owner

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