APPARATUS FOR COMPARING PERFORMANCE OF ELECTRONIC DEVICES

A test apparatus including a data interface configured to couple with at least one of a test device and a baseline device, and a computing device configured to perform a method including performing a first benchmark on a baseline device for a predetermined time interval, resulting in a first dataset representing work performed by the baseline devices, performing a second benchmark on a test device for the predetermined time interval resulting in a second dataset representing work performed by the test device, and using a heuristic including a number of tests to determine whether the test device has an acceptable level of performance relative to the baseline device.