METHOD AND APPARATUS FOR MEASURING SIGNAL QUALITY USING EYE PATTERN

Patent №

US 7,324,903

Granted

2008-01-29

Filed 2004

Owner

SAMSUNG ELECTRONICS CO, LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10919531

A signal quality measuring method and apparatus in which a quality of a signal detected from an RF signal read out from a disk or a communications channel is measured by using eye pattern signals of the detected RF signals. Eye pattern signals representing time change of a waveform of the detected signal are generated and a signal quality value is generated based on an eye depth and/or an eye width measured from the eye pattern signals. A histogram of the eye pattern signals is used to identify a plurality of main level values which are used as a reference value in measuring the signal quality. Accordingly, signal characteristics in a high-density storage medium system or communication system may be accurately represented.

AI classification

Vision0.99
Planning0.40
AI hardware0.00
Speech0.00
Evolutionary computation0.00
Natural language0.00
Machine learning0.00
Knowledge representation0.00

Ownership

SAMSUNG ELECTRONICS CO, LTD.

assignment · 160670768

Assignors

CHO, EING-SEOB, SHIM, JAE-SEONG, PARK, HYUN-SOO, LEE, JAE-WOOK, LEE, JUNG-HYUN, RYU, EUN-JIN

On an employer assignment, the assignors are typically the inventors.

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