Patent US 7,324,925

The present invention is directed to a method for information analysis used to discriminate between biased and unbiased fits. A goodness-of-fit parameter becomes a quantity of interest for analysis of multiple measurements and does so by replacing a likelihood function with a probability of the likelihood function W(L|α). The probability of the likelihood function is derived from a new posterior probability P(α|L) and the goodness-of-fit parameter G, wherein a is a set of fitting parameters, L is the likelihood function and W(L|α) is equal to the product of P(α|L) and G. Furthermore, if substantial prior information is available on α, then the probability of the fitting parameters P(α) can is used to aid in the determination of W(L|α).