METHOD AND APPARATUS FOR ANALYZING STREAKED PATTERN IMAGE

Patent №

US 7,333,641

Granted

2008-02-19

Filed 2003

Owner

NEC CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10639527

A streaked pattern image analyzing apparatus for use in an analysis of a fingerprint and the like for aiding in the identification as to whether or not an applied first streaked pattern image matches a second streaked pattern image. The apparatus comprises an image distortion modification unit for modifying data on one of the first streaked pattern image and the second streaked pattern image such that a point on a first streaked pattern image which resides on a skeleton thinned from a streak of the streaked pattern image and having a corresponding point on the second streaked pattern image is brought closer to a point on a skeleton of the second streaked pattern image corresponding to the point, and an image display unit for displaying the streaked pattern image modified by the image distortion modifying unit and the other streaked pattern image.

AI classification

Vision1.00
Machine learning0.01
AI hardware0.00
Knowledge representation0.00
Planning0.00
Natural language0.00
Speech0.00
Evolutionary computation0.00

Ownership

NEC CORPORATION

assignment · 143890549

Assignors

HARA, MASANORI, TOYAMA, HIROAKI

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC