METHOD FOR DETERMINING PROJECTED LIFETIME OF SEMICONDUCTOR DEVICES WITH ANALYTICAL EXTENSION OF STRESS VOLTAGE WINDOW BY SCALING OF OXIDE THICKNESS
Patent №
US 7,340,360
Granted
2008-03-04
Filed 2006
Owner
ADVANCED MICRO DEVICES, INC.
Lab
—
AI components
2
evo · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11349076
A method for efficiently and accurately measuring a maximum Vcc calculation or failure rate and lifetime projection for microprocessors and other semiconductor products analytically scales low voltages applied to thinner oxides to thicker oxides. The expanded voltage window that is closer to the use voltage is obtained thereby to provide accurate voltage acceleration factors and max Vce extraction.
AI classification
Ownership
ADVANCED MICRO DEVICES, INC.
assignment · 175500953
Assignors
ZHANG, JOHN, TAYLOR, KURT, ZHAO, EUGENE, MARATHE, AMIT, GEILENKEUSER, ROLF, WEIDNER, JOERG-OLIVER
On an employer assignment, the assignors are typically the inventors.