ON-DIE TEMPERATURE MONITORING IN SEMICONDUCTOR DEVICES TO LIMIT ACTIVITY OVERLOAD

Patent №

US 7,400,945

Granted

2008-07-15

Filed 2005

Owner

INTEL CORPORATION

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11088445

Thermal control for a controller in a data processing environment is described. In one embodiment, the invention includes detecting a temperature of a semiconductor device at a thermal sensor on the semiconductor device, comparing the detected temperature to a threshold, and generating a high interrupt if the temperature is above the threshold and a low interrupt if the temperature is below the threshold.

AI hardwareG06F 1/206G06F 13/1668

AI classification

AI hardware0.75
Planning0.02
Evolutionary computation0.00
Natural language0.00
Machine learning0.00
Knowledge representation0.00
Speech0.00
Vision0.00

Ownership

INTEL CORPORATION

assignment · 164170360

Assignors

RADHAKRISHNAN, SIVAKUMAR, WIZNEROWICZ, MICHAEL, GRIFFIN, JED D., MAHESWARAN, KAPILAN, RUSHFORD, SCOTT, HOTZ, DAVID J.

On an employer assignment, the assignors are typically the inventors.

From the same owner

© 2026 NYSGPT2525 LLC