X-RAY EXAMINATION APPARATUS AND METHOD

The present invention relates to an X-ray examination apparatus and a corresponding method for acquiring X-ray image data of a region of interest by use of an imaging unit (1-3) comprising an X-ray source (2) for emitting X-ray radiation and an X-ray detector (3) for detecting X-ray radiation after penetration of said region of interest. In order to provide a quick and easy method which also reduces the X-ray dose to which a patient is exposed and which allows immediate acquisition of X-ray image data from a desired and possibly optimal position, it is proposed that the X-ray examination apparatus according to the invention comprises further: processing means (22) for determining a desired position of said imaging unit (1-3), at which X-ray image data shall be acquired, based on a predetermined image acquisition plan (P) and/or an actual position (D) of an instrument (11), control means (23) for determining position parameters of said imaging unit (1-3) for said desired position, and positioning means (30) for positioning said imaging unit (1-3) at said desired position by use of said position parameters.