Patent №
US 7,541,239
Granted
2009-06-02
Filed 2006
Owner
INTEL CORPORATION
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11479762
A method of selectively forming a spacer on a first class of transistors and devices formed by such methods. The method can include depositing a conformal first deposition layer on a substrate with different classes of transistors situated thereon, depositing a blocking layer to at least one class of transistors, dry etching the first deposition layer, removing the blocking layer, depositing a conformal second deposition layer on the substrate, dry etching the second deposition layer and wet etching the remaining first deposition layer. Devices may include transistors of a first class with larger spacers compared to spacers of transistors of a second class.
AI classification
Ownership
INTEL CORPORATION
assignment · 204190679
Assignors
CURELLO, GIUSEPPE, POST, IAN R., JAN, CHIA-HONG, BOHR, MARK
On an employer assignment, the assignors are typically the inventors.