SELECTIVE SPACER FORMATION ON TRANSISTORS OF DIFFERENT CLASSES ON THE SAME DEVICE

Patent №

US 7,541,239

Granted

2009-06-02

Filed 2006

Owner

INTEL CORPORATION

Lab

AI components

1

planning

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11479762

A method of selectively forming a spacer on a first class of transistors and devices formed by such methods. The method can include depositing a conformal first deposition layer on a substrate with different classes of transistors situated thereon, depositing a blocking layer to at least one class of transistors, dry etching the first deposition layer, removing the blocking layer, depositing a conformal second deposition layer on the substrate, dry etching the second deposition layer and wet etching the remaining first deposition layer. Devices may include transistors of a first class with larger spacers compared to spacers of transistors of a second class.

PlanningH10D 30/792H10D 64/015H10D 64/021H10D 84/0167H10D 84/0184H10D 84/038H10D 30/60

AI classification

Planning0.78
Natural language0.01
Vision0.00
AI hardware0.00
Speech0.00
Machine learning0.00
Evolutionary computation0.00
Knowledge representation0.00

Ownership

INTEL CORPORATION

assignment · 204190679

Assignors

CURELLO, GIUSEPPE, POST, IAN R., JAN, CHIA-HONG, BOHR, MARK

On an employer assignment, the assignors are typically the inventors.

From the same owner

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