SYSTEMS AND METHODS OF TEST CASE GENERATION WITH FEEDBACK

Patent №

US 7,600,169

Granted

2009-10-06

Filed 2004

Owner

HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.

Lab

AI components

2

ml · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10987025

Systems and methods for implementing test case generation with feedback are disclosed. An exemplary system for test case generation with feedback comprises a plurality of knobs identifying test values for a device under test. A plurality of buckets is each associated with at least one of the test values, each bucket having a weight value for the associated test value. A failure analysis module is operatively associated with the device under test, the failure analysis module changing at least some weight values based on feedback from test operations for the device under test. A test case generator selects test values for test operations based on the weight value for the associated test value.

Machine learningAI hardwareG06F 11/263G01R 31/318307G01R 31/318371

AI classification

Machine learning0.78
AI hardware0.56
Knowledge representation0.43
Planning0.21
Evolutionary computation0.00
Vision0.00
Natural language0.00
Speech0.00

Ownership

HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.

assignment · 159920069

Assignors

WELLER, CHRISTOPHER TODD

On an employer assignment, the assignors are typically the inventors.

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