SURFACE CONFIGURATION MEASURING METHOD AND SURFACE CONFIGURATION MEASURING SYSTEM

Patent №

US 7,671,998

Granted

2010-03-02

Filed 2005

Owner

KABUSHIKI KAISHA TOPCON

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11096648

A measuring method, comprising a step of drawing a line on a surface such as ground surface, a step of performing measurement along the line on a predetermined measurement range including the line, a step of acquiring an image of a range including the predetermined measurement range as an image data, a step of superimposing the image data on a measurement data, and a step of calculating a measurement data of the line from line position in the image data and from the measurement data near the line.

AI classification

Vision1.00
Evolutionary computation0.00
Natural language0.00
Speech0.00
AI hardware0.00
Machine learning0.00
Knowledge representation0.00
Planning0.00

Ownership

KABUSHIKI KAISHA TOPCON

assignment · 165320764

Assignors

OHTOMO, FUMIO, OTANI, HITOSHI

On an employer assignment, the assignors are typically the inventors.

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