Patent №
US 7,679,757
Granted
2010-03-16
Filed 2003
Owner
BYTEWISE MEASUREMENT SYSTEMS, LLC
+2 more
Lab
—
AI components
1
planning
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
10699522
A non contact measurement system for in-process measurement of a work piece to is described. There is provided a sensor chassis that includes one or more contour sensors for capturing the profile of a work piece and outputting coordinate values describing one or more points representative of the profile of the work piece.
AI classification
Ownership
BYTEWISE MEASUREMENT SYSTEMS, LLC
assignment · 238130794
BYTEWISE DEVELOPMENT CORP.
correct · 273080057
STARRETT BYTEWISE DEVELOPMENT, INC.
assignment · 273090261
Assignors
HARRIS, MICHAEL, HIDLE, ANDY, BURDETTE, BEN
On an employer assignment, the assignors are typically the inventors.