METHOD AND APPARATUS FOR VISUAL INSPECTION

Patent №

US 7,706,598

Granted

2010-04-27

Filed 2004

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10953060

A visual inspection apparatus includes an image-data acquisition unit for acquiring plural pieces of image data A to C on an inspection target, image comparison units for comparing the image data A to C with each other thereby to create plural pieces of sign-affixed difference-image data D and E, the image data A to C being acquired by the image-data acquisition unit, difference-image comparison units for determining the difference between the sign-affixed difference-image data D and E created by the image comparison units, and a judgment unit for subjecting, to a threshold-value processing, difference data F between the difference-image data D and E, the difference data F being acquired by the difference-image comparison units, obtaining a detection sensitivity by enlarging the difference between an abnormal signal level of an image of an area where an abnormality exists from the visual inspection.

VisionG01N 21/8803G01N 21/9501G01N 21/95607G06T 7/001G06V 10/993G01N 21/8851G01N 2021/8893G06T 2207/30148

AI classification

Vision1.00
Evolutionary computation0.03
AI hardware0.01
Natural language0.00
Knowledge representation0.00
Machine learning0.00
Planning0.00
Speech0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 161290225

Assignors

SHIMURA, KEI

On an employer assignment, the assignors are typically the inventors.

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