Patent №
US 7,723,682
Granted
2010-05-25
Filed 2008
Owner
HITACHI HIGH-TECHNOLOGIES CORPORATION
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
12024357
In order to correct measurement magnification and measurement position of a spectral image with high efficiency and with high accuracy using an electronic spectroscope and a transmission electron microscope regarding the spectral image formed in two orthogonal axes which are an amount of energy loss axis and a measurement position information axis; a method for correcting magnification and position and a system for correcting magnification and position, both of which are capable of correcting measurement magnification and measurement position of a spectral image with high efficiency and with high accuracy using an electronic spectroscope and a transmission electron microscope regarding the spectral image formed in two orthogonal axes which are an amount of energy loss axis and a measurement position information axis, are provided.
AI classification
Ownership
HITACHI HIGH-TECHNOLOGIES CORPORATION
assignment · 208030508
Assignors
TERADA, SHOHEI, TANIGUCHI, YOSHIFUMI
On an employer assignment, the assignors are typically the inventors.