SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS

Patent №

US 7,764,367

Granted

2010-07-27

Filed 2007

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

2

vision · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11834217

A surface inspection method and a surface inspection apparatus in which a plurality of photodetectors are arranged in a plurality of directions so that light scattered, diffracted or reflected on a surface of an object to be inspected or in the vicinity of the surface is detected and a plurality of signals obtained by this are subjected to weighted addition processing or weighted averaging processing by linear combination.

VisionAI hardwareG01N 21/9501G01N 21/4738

AI classification

Vision1.00
AI hardware0.79
Speech0.02
Machine learning0.01
Evolutionary computation0.01
Natural language0.00
Knowledge representation0.00
Planning0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 209220052

Assignors

MATSUI, SHIGERU

On an employer assignment, the assignors are typically the inventors.

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