APPARATUS AND METHOD FOR CLASSIFYING DEFECTS USING MULTIPLE CLASSIFICATION MODULES

Patent №

US 7,873,205

Granted

2011-01-18

Filed 2004

Owner

HITACHI HIGH-TECHNOLOGIES CORPORATION

Lab

AI components

5

ml · vision · kr · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

10809464

A classification model optimum for realization of a defect classification request by a user is not known by the user. Then, the user sets a classification model which is not necessarily suitable and makes classification, resulting in degradation in classification performance. Therefore, the present invention automatically generates plural potential classification models and combines class likelihoods calculated from the plural classification models to classify. To combine, an index about the adequacy of each model, in other words, an index indicating a reliable level of likelihood calculated from the each potential classification model, is also calculated. Considering the calculated result, the class likelihoods calculated from the plural classification models are combined to execute classification.

Machine learningVisionKnowledge representationPlanningAI hardwareG06T 7/0006G06F 18/2415G06F 18/254G06V 10/764G06T 2207/30141G06T 2207/30148

AI classification

Vision1.00
Machine learning1.00
Knowledge representation1.00
Planning1.00
AI hardware1.00
Natural language0.00
Evolutionary computation0.00
Speech0.00

Ownership

HITACHI HIGH-TECHNOLOGIES CORPORATION

assignment · 160770202

Assignors

OKUDA, HIROHITO, TAKAGI, YUJI, HONDA, TOSHIFUMI, MIYAMOTO, ATSUSHI, HIRAI, TAKEHIRO

On an employer assignment, the assignors are typically the inventors.

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