METHOD OF INSPECTION FOR INNER DEFECTS OF AN OBJECT AND APPARATUS FOR SAME

Patent №

US 7,933,441

Granted

2011-04-26

Filed 2005

Owner

HITACHI, LTD.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11259251

It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.

VisionG06T 7/0004G01N 23/046G06T 7/66G01N 2223/419G06T 2207/30164

AI classification

Vision1.00
Knowledge representation0.05
Natural language0.00
Machine learning0.00
AI hardware0.00
Speech0.00
Planning0.00
Evolutionary computation0.00

Ownership

HITACHI, LTD.

assignment · 171490061

Assignors

NUMATA, SHOUHEI, TAKAGI, TAROU, SADAOKA, NORIYUKI

On an employer assignment, the assignors are typically the inventors.

© 2026 NYSGPT2525 LLC