Patent №
US 7,933,441
Granted
2011-04-26
Filed 2005
Owner
HITACHI, LTD.
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11259251
It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.
AI classification
Ownership
HITACHI, LTD.
assignment · 171490061
Assignors
NUMATA, SHOUHEI, TAKAGI, TAROU, SADAOKA, NORIYUKI
On an employer assignment, the assignors are typically the inventors.