IMAGE INSPECTION METHOD AND IMAGE INSPECTION APPARATUS EMPLOYING THE SAME

Patent №

US 7,965,883

Granted

2011-06-21

Filed 2007

Owner

MITSUBISHI ELECTRIC CORPORATION

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11798477

The method comprises a first step (S1 in FIG. 1) of obtaining a transmission image, a second step (S2) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S3) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S4) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S5) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S3) and the binarized image stored at the fourth step (S4), and a sixth step (S6) of deciding the quality of the object to-be-inspected from the binary feature quantities.

VisionG06T 7/0004G06T 2207/30148

AI classification

Vision1.00
Evolutionary computation0.02
AI hardware0.02
Machine learning0.00
Natural language0.00
Knowledge representation0.00
Planning0.00
Speech0.00

Ownership

MITSUBISHI ELECTRIC CORPORATION

assignment · 193670963

Assignors

NISHINO, HIROHISA, UNO, MASAHIKO

On an employer assignment, the assignors are typically the inventors.

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