METHOD AND DEVICE FOR PREPARING AN IMPLANT FROM AN IMPLANT MATERIAL

A method and device for preparing an implant from an implant material are provided. A defect image of the defect which has a defect contour is made available, in which a first calibration member arranged in or adjacent to the defect is displayed. A second calibration member is arranged on or adjacent to the implant material to be processed, this second calibration member corresponding to the first calibration member. A real-time image of the implant material is displayed on a display device. The defect image is displayed on the display device and superimposed on the real-time image so that the first and the second calibration members are displayed one on top of the other. A processing tool is displayed on the display device in the real-time image and moved over the implant material so that it follows the defect contour displayed in the defect image.