METHOD AND APPARATUS FOR IDENTIFYING PATHS HAVING APPROPRIATE LENGTHS FOR FAULT SIMULATION

Patent №

US 8,166,380

Granted

2012-04-24

Filed 2006

Owner

FUJITSU LIMITED

Lab

AI components

1

kr

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11521173

A fault analysis apparatus includes: an extracting unit that extracts a segment including a point of fault from a plurality of paths in a target circuit; a detecting unit that detects a candidate path that extends, via the segment, from an upstream circuit element to a downstream circuit element; a judging unit that judges whether length of the candidate path is longer than a predetermined length; and a determining unit that determines whether to determine the candidate path as a target path to be subjected to a fault simulation based on a result of judgment.

Knowledge representationG01R 31/318357G01R 31/318328

AI classification

Knowledge representation0.98
AI hardware0.04
Evolutionary computation0.02
Natural language0.01
Planning0.00
Machine learning0.00
Vision0.00
Speech0.00

Ownership

FUJITSU LIMITED

assignment · 183170172

Assignors

HIRAIDE, TAKAHISA

On an employer assignment, the assignors are typically the inventors.

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