METHOD AND APPARATUS FOR IDENTIFYING PATHS HAVING APPROPRIATE LENGTHS FOR FAULT SIMULATION
Patent №
US 8,166,380
Granted
2012-04-24
Filed 2006
Owner
FUJITSU LIMITED
Lab
—
AI components
1
kr
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11521173
A fault analysis apparatus includes: an extracting unit that extracts a segment including a point of fault from a plurality of paths in a target circuit; a detecting unit that detects a candidate path that extends, via the segment, from an upstream circuit element to a downstream circuit element; a judging unit that judges whether length of the candidate path is longer than a predetermined length; and a determining unit that determines whether to determine the candidate path as a target path to be subjected to a fault simulation based on a result of judgment.
AI classification
Ownership
FUJITSU LIMITED
assignment · 183170172
Assignors
HIRAIDE, TAKAHISA
On an employer assignment, the assignors are typically the inventors.