OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTIC MEASUREMENT METHOD SUITABLE FOR SPECTRUM MEASUREMENT
Patent №
US 8,169,607
Granted
2012-05-01
Filed 2009
Owner
OTSUKA ELECTRONICS CO., LTD.
Lab
—
AI components
1
evo
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
12573140
A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.
AI classification
Ownership
OTSUKA ELECTRONICS CO., LTD.
assignment · 233230222
Assignors
SANO, HIROYUKI, OKAWAUCHI, MAKOTO, OSHIMA, KOSEI, OHKUBO, KAZUAKI, MIZUGUCHI, TSUTOMU, SHIMA, SHIRO
On an employer assignment, the assignors are typically the inventors.