OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTIC MEASUREMENT METHOD SUITABLE FOR SPECTRUM MEASUREMENT

Patent №

US 8,169,607

Granted

2012-05-01

Filed 2009

Owner

OTSUKA ELECTRONICS CO., LTD.

Lab

AI components

1

evo

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

12573140

A processing unit obtains a first spectrum detected in a first detection area and a first signal intensity detected in a second detection area after the light entering the housing is cut off, and then calculates a first correction spectrum by subtracting a first correction value calculated based on the first signal intensity from each component value of the first spectrum. The processing unit obtains a second spectrum detected in the first detection area and a second signal intensity detected in the second detection area while a cut-off portion is opened, and then calculates a second correction spectrum by subtracting a second correction value calculated based on the second signal intensity from each component value of the second spectrum. The processing unit calculates an output spectrum representing a measurement result by subtracting a corresponding component value of the first correction spectrum from each component value of the second correction spectrum.

Evolutionary computationG01J 3/02G01J 3/0232G01J 3/28G01J 1/0219

AI classification

Evolutionary computation0.94
Natural language0.00
Vision0.00
Planning0.00
Knowledge representation0.00
Machine learning0.00
Speech0.00
AI hardware0.00

Ownership

OTSUKA ELECTRONICS CO., LTD.

assignment · 233230222

Assignors

SANO, HIROYUKI, OKAWAUCHI, MAKOTO, OSHIMA, KOSEI, OHKUBO, KAZUAKI, MIZUGUCHI, TSUTOMU, SHIMA, SHIRO

On an employer assignment, the assignors are typically the inventors.

From the same owner

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