OFF-LINE PROGRAM ANALYSIS AND RUN-TIME INSTRUMENTATION

Patent №

US 8,291,399

Granted

2012-10-16

Filed 2008

Owner

AVAYA TECHNOLOGY LLC

Lab

AI components

1

hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

12056064

A technique is disclosed for determining off-line the number and location of instrumentation probes to be inserted into a program under testing, and subsequently instrumenting the program at run-time based on the off-line analysis. In accordance with the illustrative embodiment, an off-line analyzer first determines instrumentation locations for a program under test in accordance with a method called the Super Nested Block Method. After the instrumentation locations have been determined, a testing/monitoring tool executes the program and a run-time instrumenter in parallel. The run-time instrumenter accordingly inserts probes into the program, removes probes after they have been executed once, and generates and reports information about code coverage based on the probes.

AI hardwareG06F 11/3644G06F 11/3676

AI classification

AI hardware0.99
Planning0.48
Knowledge representation0.14
Evolutionary computation0.00
Natural language0.00
Machine learning0.00
Vision0.00
Speech0.00

Ownership

AVAYA TECHNOLOGY LLC

assignment · 207700871

Assignors

LI, JUAN JENNY, WEISS, DAVID MANDEL

On an employer assignment, the assignors are typically the inventors.

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