SCANNING BEAM DEVICE CALIBRATION

Patent №

US 8,305,432

Granted

2012-11-06

Filed 2007

Owner

UNIVERSITY OF WASHINGTON

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11652411

Scanning beam device calibration using a calibration pattern is disclosed. In one aspect, a method may include acquiring an image of a calibration pattern using a scanning beam device. The acquired image may be compared with a representation of the calibration pattern. The scanning beam device may be calibrated based on the comparison. Software and apparatus to perform these and other calibration methods are also disclosed.

VisionA61B 1/00096A61B 1/00057A61B 1/00172A61B 5/0062G06T 7/11G06T 7/80G06V 10/147G06V 30/144+1 more

AI classification

Vision0.98
AI hardware0.15
Knowledge representation0.03
Natural language0.00
Evolutionary computation0.00
Machine learning0.00
Speech0.00
Planning0.00

Ownership

UNIVERSITY OF WASHINGTON

assignment · 187940214

Assignors

JOHNSTON, RICHARD S.

On an employer assignment, the assignors are typically the inventors.

From the same owner

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