UNEVENNESS INSPECTION METHOD, METHOD FOR MANUFACTURING DISPLAY PANEL, AND UNEVENNESS INSPECTION APPARATUS
Patent №
US 8,320,658
Granted
2012-11-27
Filed 2007
Owner
KABUSHIKI KAISHA TOSHIBA
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
11851806
An unevenness inspection method for inspecting presence of unevenness in a panel material, the method includes: acquiring a plurality of primary images by imaging the panel material under inspection on a plurality of levels of condition; creating a plurality of secondary images by processing the plurality of primary images to enhance variation of the image; creating a composite image by combining the plurality of secondary images with a prescribed weighting; and determining the presence of unevenness using the composite image, the prescribed weighting being determined so that a region having the unevenness can be distinguished from the other region, when the plurality of secondary images are created for the panel material for training use having unevenness and are combined into a composite image.
AI classification
Ownership
KABUSHIKI KAISHA TOSHIBA
assignment · 201940728
Assignors
TANIZAKI, HIROYUKI, TOYOSHIMA, NAOKO, OKAMOTO, YOSUKE, TAKASE, YASUNORI
On an employer assignment, the assignors are typically the inventors.