UNEVENNESS INSPECTION METHOD, METHOD FOR MANUFACTURING DISPLAY PANEL, AND UNEVENNESS INSPECTION APPARATUS

Patent №

US 8,320,658

Granted

2012-11-27

Filed 2007

Owner

KABUSHIKI KAISHA TOSHIBA

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

11851806

An unevenness inspection method for inspecting presence of unevenness in a panel material, the method includes: acquiring a plurality of primary images by imaging the panel material under inspection on a plurality of levels of condition; creating a plurality of secondary images by processing the plurality of primary images to enhance variation of the image; creating a composite image by combining the plurality of secondary images with a prescribed weighting; and determining the presence of unevenness using the composite image, the prescribed weighting being determined so that a region having the unevenness can be distinguished from the other region, when the plurality of secondary images are created for the panel material for training use having unevenness and are combined into a composite image.

AI classification

Vision1.00
Evolutionary computation0.15
Machine learning0.08
Knowledge representation0.00
Speech0.00
Natural language0.00
AI hardware0.00
Planning0.00

Ownership

KABUSHIKI KAISHA TOSHIBA

assignment · 201940728

Assignors

TANIZAKI, HIROYUKI, TOYOSHIMA, NAOKO, OKAMOTO, YOSUKE, TAKASE, YASUNORI

On an employer assignment, the assignors are typically the inventors.

From the same owner

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