ESTIMATING THE RATE OF STORAGE CORRUPTION FROM ATOMIC PARTICLES

Methods and systems estimate a rate of corruption of storage bits in a logic circuit. One or more processors execute instructions that cause the processors to perform the operations that follow. A description is input describing an environment of the logic circuit, and the description of the environment includes a position of the logic circuit. An atomic particle flux density at the logic circuit is estimated as a function of the description of the environment. A specification is input that specifies the storage bits in the logic circuit. The rate of corruption of the storage bits is determined as a function of the atomic particle flux density and a quantification of the storage bits in the logic circuit.