DEVICE FOR MEASURING THE DEFECTS OF AN IMAGING INSTRUMENT WITH TWO OPTO-ELECTRONIC SENSORS
Patent №
US 8,415,599
Granted
2013-04-09
Filed 2010
Owner
THALES
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
12742614
The present invention relates to a device for measuring defects of an imaging instrument with a sensor that is accurate, simple to produce and implement and inexpensive. According to the invention, this device comprising at least one second sensor, similar to the first, inclined relative thereto and imaging the same region as the first sensor, and a device for calculating the defocusing of each element of this other sensor.
VisionG02B 7/38
AI classification
Vision0.97
Knowledge representation0.13
Planning0.01
Natural language0.00
AI hardware0.00
Machine learning0.00
Speech0.00
Evolutionary computation0.00
Ownership
THALES
assignment · 245120607
Assignors
PIGOUCHE, OLIVIER, DANTES, DIDIER
On an employer assignment, the assignors are typically the inventors.
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