METHOD FOR TESTING ELECTRONIC DEVICE

Patent №

US 8,463,570

Granted

2013-06-11

Filed 2010

Owner

HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.

+1 more

Lab

AI components

1

evo

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

12944750

A method for testing an electronic device is implemented with a host computer. The host computer detects a test status of the electronic device. The host computer stores a test order table that indicates the test status and test order corresponding to the test status. The host computer transmits a test order based on the test status and the test order table to the electronic device. The electronic device executes a self-test based on the test order.

AI classification

Evolutionary computation0.51
Planning0.12
Knowledge representation0.01
Natural language0.00
Vision0.00
Speech0.00
AI hardware0.00
Machine learning0.00

Ownership

HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.

assignment · 253570084

HON HAI PRECISION INDUSTRY CO., LTD.

assignment · 253570084

Assignors

LIN, YU-LONG, DONG, HUA, TAN, JIE-JUN, XIE, YI-YONG

On an employer assignment, the assignors are typically the inventors.

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