SUPER-RESOLUTION MICROSCOPY SYSTEM USING SPECKLE ILLUMINATION AND ARRAY SIGNAL PROCESSING
Patent №
US 8,552,402
Granted
2013-10-08
Filed 2011
Owner
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
Lab
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AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13267051
A nano-scale resolution fluorescence microscopy system and a method of obtaining an image using the nano-scale resolution microscopy system, and more particularly, a method and a microscopy system, capable of observing fluorescence probes in high resolution by radiating an irregular diffused light to have an incoherent speckle pattern that has low correlation in an adjacent space are disclosed. According to embodiments of the present invention, a diffraction limit of a fluorescence microscope may be overcome, and a super high resolution image on a nanometer scale may be obtained.
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Ownership
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
assignment · 270250024
Assignors
YE, JONG CHUL, JANG, JAE DUCK
On an employer assignment, the assignors are typically the inventors.