SYSTEM AND METHOD FOR PROVIDING ADAPTIVE MANUFACTURING DIAGNOSES IN A CIRCUIT BOARD ENVIRONMENT

An example method is provided and includes collecting inputs for a circuit board under test; evaluating historical repair records using a neuron network; providing repair actions for the circuit board based on the historical repair records; and providing an output reflecting a particular component of the circuit board to be replaced or to be repaired, where the output is associated with a developed probability of successfully fixing an issue that was identified by the test. In more specific implementations, the inputs include fault syndromes and log files associated with the circuit board under test. Additionally, at least one of the inputs of the neuron network is a syndrome vector extracted from a failure log. In yet other instances, particular outputs having higher probabilities are selected as the repair actions. The neuron network can be weighted using diagnosis knowledge weights.