ERROR DETECTION METHOD AND ITS SYSTEM FOR EARLY DETECTION OF ERRORS IN A PLANAR OR FACILITIES

Patent №

US 8,630,962

Granted

2014-01-14

Filed 2011

Owner

HITACHI, LTD.

Lab

AI components

4

ml · vision · planning · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13057831

Provided are a method which permits complete training data and data with added errors, and enables the early and accurate discovery of errors in facilities such as a plant, and a system thereof. To achieve the objectives, (1) the behavior of temporal data is observed over time, and the trace is divided into clusters; (2) the divided cluster groups are modeled in sub spaces, and the discrepancy values are calculated as errors candidates; (3) the training data are used (compare, reference, etc.) for reference to determine the state transitions caused by the changes over time, the environmental changes, the maintenance (parts replacement), and the operation states; and (4) the modeling is a sub space method such as regression analysis or projection distance method of every N data removing N data items, (N=0, 1, 2, . . . ) (for example, when N=1, one error data item is considered to have been added, this data is removed, then the modeling is performed), or a local sub space method. Linear fitting in regression analysis is equivalent to the lowest order regression analysis.

Machine learningVisionPlanningAI hardwareG05B 23/0254G06F 18/21375G06F 18/24137G06F 18/2433G06F 2218/12

AI classification

Machine learning1.00
Planning1.00
AI hardware1.00
Vision0.96
Knowledge representation0.18
Evolutionary computation0.07
Natural language0.01
Speech0.00

Ownership

HITACHI, LTD.

assignment · 261560680

Assignors

MAEDA, SHUNJI, SHIBUYA, HISAE

On an employer assignment, the assignors are typically the inventors.

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