ERROR DETECTION METHOD AND ITS SYSTEM FOR EARLY DETECTION OF ERRORS IN A PLANAR OR FACILITIES
Patent №
US 8,630,962
Granted
2014-01-14
Filed 2011
Owner
HITACHI, LTD.
Lab
—
AI components
4
ml · vision · planning · hardware
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13057831
Provided are a method which permits complete training data and data with added errors, and enables the early and accurate discovery of errors in facilities such as a plant, and a system thereof. To achieve the objectives, (1) the behavior of temporal data is observed over time, and the trace is divided into clusters; (2) the divided cluster groups are modeled in sub spaces, and the discrepancy values are calculated as errors candidates; (3) the training data are used (compare, reference, etc.) for reference to determine the state transitions caused by the changes over time, the environmental changes, the maintenance (parts replacement), and the operation states; and (4) the modeling is a sub space method such as regression analysis or projection distance method of every N data removing N data items, (N=0, 1, 2, . . . ) (for example, when N=1, one error data item is considered to have been added, this data is removed, then the modeling is performed), or a local sub space method. Linear fitting in regression analysis is equivalent to the lowest order regression analysis.
AI classification
Ownership
HITACHI, LTD.
assignment · 261560680
Assignors
MAEDA, SHUNJI, SHIBUYA, HISAE
On an employer assignment, the assignors are typically the inventors.