DOUBLE-SIDED IMAGE SENSOR FORMED ON A SINGLE SEMICONDUCTOR WAFER DIE

Patent №

US 8,686,342

Granted

2014-04-01

Filed 2012

Owner

OMNIVISION TECHNOLOGIES, INC.

Lab

AI components

2

vision · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13442562

An example double-sided image sensor includes a semiconductor die, a photodetector, a charge-to-voltage converter, and support circuitry. The semiconductor die has a first side and a second side that is opposite the first side. The photodetector is disposed within the semiconductor die on the first side for accumulating an image charge in response to light incident on the first side. The charge-to-voltage converter is disposed within the semiconductor die on the first side. The transfer gate is also disposed on the first side of the semiconductor die between the photodetector and the charge-to-voltage converter to transfer the image charge from the photodetector to the charge-to-voltage converter. Support circuitry of the image sensor is disposed within the semiconductor die on the second side and is electrically coupled to the charge-to-voltage converter.

VisionAI hardwareH10F 39/803H10F 39/807H10F 39/809H10F 39/811H10F 39/813

AI classification

Vision0.66
AI hardware0.59
Machine learning0.00
Natural language0.00
Knowledge representation0.00
Evolutionary computation0.00
Speech0.00
Planning0.00

Ownership

OMNIVISION TECHNOLOGIES, INC.

assignment · 280150350

Assignors

HONG, XIAO YING, MASSETTI, DOMINIC

On an employer assignment, the assignors are typically the inventors.

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