METHOD OF OPTICAL PROXIMITY CORRECTION IN COMBINATION WITH DOUBLE PATTERNING TECHNIQUE

Patent №

US 8,701,052

Granted

2014-04-15

Filed 2013

Owner

UNITED MICROELECTRONICS CORP.

Lab

AI components

1

vision

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13748564

A method of optical proximity correction (OPC) includes the following steps. A layout pattern is provided to a computer system, and the layout pattern is classified into at least a first sub-layout pattern and at least a second sub-layout pattern. Then, at least an OPC calculation is performed respectively on the first sub-layout pattern and the second sub-layout pattern to form a corrected first sub-layout pattern and a corrected second sub-layout pattern. The corrected first sub-layout pattern/the corrected second sub-layout pattern and the layout pattern are compared to select a part of the corrected first sub-layout pattern/the corrected second sub-layout pattern as a first selected pattern/the second selected pattern, and the first selected pattern/the second selected pattern is further altered to modify the corrected first sub-layout pattern/the corrected second sub-layout pattern as a third sub-layout pattern/a fourth sub-layout pattern.

VisionG03F 7/70466G03F 1/36G03F 1/70G03F 7/70441

AI classification

Vision0.54
Evolutionary computation0.18
Knowledge representation0.11
Natural language0.01
Machine learning0.00
Planning0.00
AI hardware0.00
Speech0.00

Ownership

UNITED MICROELECTRONICS CORP.

assignment · 296820661

Assignors

KUO, HUI-FANG, CHEN, MING-JUI, WANG, CHENG-TE

On an employer assignment, the assignors are typically the inventors.

From the same owner

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