METHOD OF OPTICAL PROXIMITY CORRECTION IN COMBINATION WITH DOUBLE PATTERNING TECHNIQUE
Patent №
US 8,701,052
Granted
2014-04-15
Filed 2013
Owner
UNITED MICROELECTRONICS CORP.
Lab
—
AI components
1
vision
Assignment
Recorded
Dataset
AIPD
2023_r1 edition
Application
13748564
A method of optical proximity correction (OPC) includes the following steps. A layout pattern is provided to a computer system, and the layout pattern is classified into at least a first sub-layout pattern and at least a second sub-layout pattern. Then, at least an OPC calculation is performed respectively on the first sub-layout pattern and the second sub-layout pattern to form a corrected first sub-layout pattern and a corrected second sub-layout pattern. The corrected first sub-layout pattern/the corrected second sub-layout pattern and the layout pattern are compared to select a part of the corrected first sub-layout pattern/the corrected second sub-layout pattern as a first selected pattern/the second selected pattern, and the first selected pattern/the second selected pattern is further altered to modify the corrected first sub-layout pattern/the corrected second sub-layout pattern as a third sub-layout pattern/a fourth sub-layout pattern.
AI classification
Ownership
UNITED MICROELECTRONICS CORP.
assignment · 296820661
Assignors
KUO, HUI-FANG, CHEN, MING-JUI, WANG, CHENG-TE
On an employer assignment, the assignors are typically the inventors.