System and Method for Identifying Defects in a Material

Patent №

US 8,750,596

Granted

2014-06-10

Filed 2011

Owner

COGNEX CORPORATION

Lab

AI components

4

ml · vision · kr · hardware

Assignment

Recorded

Dataset

AIPD

2023_r1 edition

Application

13213993

Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image.

Machine learningVisionKnowledge representationAI hardwareG06T 7/001G06T 7/0004G06T 7/13G06T 7/136G06T 7/181G06T 2207/30148

AI classification

Vision1.00
AI hardware0.99
Knowledge representation0.69
Machine learning0.52
Evolutionary computation0.17
Planning0.08
Natural language0.05
Speech0.00

Ownership

COGNEX CORPORATION

assignment · 271490320

Assignors

WANG, XIAOGUANG

On an employer assignment, the assignors are typically the inventors.

From the same owner

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