EDGE DETECTION USING STRUCTURED ILLUMINATION

A machine vision inspection system (MVIS) and a related light stripe edge feature location method are disclosed. The MVIS comprises a control system, a light stripe projection system, an imaging system, and a user interface. In a region of interest including the edge feature, the light stripe projection system focuses a light stripe transverse to the edge direction and across the edge feature, such that the light stripe has a changing stripe intensity profile along the light stripe. The imaging system acquires an image of the light stripe and the control system analyzes the image to determine the location of the edge feature based on a changing light intensity profile along the stripe. The method may be implemented in an edge detection video tool. The method may be advantageous for inspecting highly textured, beveled, chamfered, rounded or damaged edges, for example.